Assistant Professor of Physics

Dr. Kumon received his B.S. in Physics and Mathematics from Michigan State University and his Ph.D. in Physics with specialization in physical acoustics from The University of Texas at Austin. He subsequently worked as a research physicist at the National Institutes of Standards and Technology (Materials Reliability Division), University of Windsor (Physics), Case Western Reserve University (Biomedical Engineering), and University of Michigan (Biomedical Engineering).

Dr. Kumon's research interests are broadly themed around the use of ultrasound for materials characterization, diagnostic imaging, and therapeutic applications. In the biomedical arena, he has investigated high-frequency ultrasound for ex vivo characterization of breast cancer and endoscopic ultrasound for improved in vivo diagnosis of pancreatic cancer. Dr. Kumon has also studied the mechanisms and bioeffects of sonoporation, the therapeutic use of ultrasound and microbubbles to enhance the delivery of drugs to cells, via fluorescence and high-speed brightfield microscopy.  His most recent work has investigated the effects of HIFU on cardiac electrophysiology using optical and infrared imaging.

Dr. Kumon’s teaching experience has ranged from introductory to upper-division physics courses, mentoring undergraduate and graduate research projects, and instructing radiology residents in the physics and technology of ultrasound.  He is currently the advisor for both sections of Kettering’s Society of Physics Students (SPS) and Sigma Pi Sigma (Physics Honor Society) chapters. He appreciates the dedication of Kettering students and faculty alike in their efforts to promote an environment for productive teaching and learning.

Ultrasound-mediated drug delivery (sonoporation), Therapeutic High-Intensity Focused Ultrasound (HIFU), Ultrasound imaging and tissue characterization for cancer diagnosis, Acoustical non-destructive evaluation and materials characterization, Nonlinear surface acoustic waves (SAWs) in crystalline and thin-film systems

2-323 J