B. Roughani, U. Ramabadran, D. Phillips, W.C. Mitchel, and C.L.
Neslen, "Chem-Mechanical Polishing and Rapid Thermal Annealing of
SiC: Raman Spectroscopy and ESCA (XPS) Studies";, In preparation for
the proceedings of the up coming Materials Research Society (MRS Fall
2000 meeting), Boston, MA, Noveber , 2000.
W.C. Mitchel, J. Brown, K. Malalingham, F.D. Orazio,Jr., P. Pirouz,
H.J. R. Tseng, U. Ramabadran, and B. Roughani, "Comparison of Mechanical
and Chemomechanical Polished SiC Wafers Using Photon Backscattering",
Conference Proceedings; International Conference on SiC and Related
Materials; 1999, in press (2000).
W. C. Mitchel, J. Brown, K. Mahalingam, F. D. Orazio Jr., P. Pirans, H. J. Tseng, U. Ramabadran, B. Roughani, "Comparison of Mechanical and ChemoMechanical Polished SiC Wafers using Photobackscattering," Proceedings of the International Conference on SiC and Related Materials (1999).
D. L. Fenimore, K. L. Schepler, D. E. Zelmon, S. Kuck, U. Ramabadran, P. V. Richter, and D. Small, "Rubidium titanyl arsenate difference frequency generation and validation of new Sellmeier coefficients," J. Opt. Soc. Am. B 13 1935 (1996)
U. Ramabadran, D. E. Zelmon, R. Vuppuladhadium , and D. Small, "Optical Characterization of triallyl thiourea cadmium chloride," Applied Optics (1996)
D. L. Fenimore, K. L. Schepler, U. Ramabadran, and S. R. McPherson, "IR Corrected Sellmeier coefficients for potassium titanyl arsenate," J. Opt. Soc. Am. B 12, 794 (1995)
